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Scanning Electron Microscope

Scanning Electron Microscope

Scanning Electron Microscope

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Scanning Electron Microscope

Description:

Scanning Electron

Characterization of surfaces of materials: – Easy Probe, a compact scanning electron microscope (SEM) fully integrated with a selected energy dispersive X-ray microanalyser (EDX).

Technical Specifications:

  • Electron Gun: Tungsten heated cathode
  • Magnification: 3x to 1,000,000x (for 5’’ image width in Continual Wide Field/Resolution)
  • Maximum Field of View: 24 mm at WD 30 mm
  • Accelerating Voltage: 200 V to 30 kV
  • Probe Current: 1 pA to 2 µA
  • Scanning Speed: From 20 ns to 10 ms per pixel adjustable in steps or continuously

Scanning Features:

  • Point & Line Scan, Focus Window – shape, size and position continuously adjustable, Dynamic Focus – in plane or folded plane tilted up to ±70
  • Deg, Image rotation, Image shift, Tilt compensation, 3D Beam –defined tilting scanning axis around XY axis, Live Stereoscopic Imaging, Other scanning shapes available through the Draw Beam software

Image File format:

  • BMP, TIFF, JPEG (Selectable)

Control:

  • Computer (PC) interface

Accessories:

  • Computer, LCD Display
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